BARRA - Vincent
B143 ISIMA
vincent.barra@isima.fr
04 73 40 74 92
Enseignant chercheur
https://perso.isima.fr/~vibarra/
Axe SIC : Systèmes d’Information et de Communication
Thème(s) : Données, Services, Intelligence
Dernière(s) publication(s) au LIMOS :
Toutes les publications de Vincent BARRA au LIMOS
Dernière(s) publication(s) au LIMOS :
Dernière(s) publication(s) au LIMOS :
| 2025
COMM |
Aya Ferchichi, Ali Ben Abbess, Vincent Barra, Imed Riadh Farah
Trustworthy AI for Spatio-Temporal Forecasting via Counterfactual Causality IEEE International Conference on Tools with Artificial Intelligence - 2025 |
Informatique/Apprentissage |
| 2025
COMM |
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Vincent Barra, Johann Foucher
Deep Learning-Based on Feature Enhancement Module for Outer and Inner Object Segmentation in Semiconductor Images: Applications in Annotation and Metrology 17th International Conference on Quality Control by Artificial Vision (QCAV) - 2025 |
Informatique/Apprentissage |
| 2025
COMM |
Marion Grould, Alexandre Seiller, Julien Baderot, Arnaud Guillin, Vincent Barra, Léo Mazauric, Ali Hallal, Sergio Martinez, Johann Foucher
Process optimization assistant powered with AI driven digital twin: multiobjective processes use case DTCO and Computational Patterning IV - 2025 |
Informatique/Apprentissage |
| 2025
COMM |
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Léo Mazauric, Vincent Barra, Sergio Martinez, Johann Foucher
Metrology and segmentation in SEM/TEM imaging: accelerating semiconductor analysis through advanced deep learning techniques Metrology, Inspection, and Process Control XXXIX - 2025 |
Informatique/Apprentissage |
| 2025
ART |
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Vincent Barra, Léo Mazauric, Johann Foucher
Deep Learning-Driven Automation of Inner and Outer Objects Segmentation in SEM/TEM Imaging for High-Throughput Semiconductor Metrology Journal of Micro/Nanopatterning, Materials, and Metrology - 2025 |
Informatique/Apprentissage |