BARRA - Vincent



B143 ISIMA
vincent.barra@isima.fr
04 73 40 74 92
Enseignant chercheur
https://perso.isima.fr/~vibarra/
Axe SIC : Systèmes d’Information et de Communication
Thème(s) : Données, Services, Intelligence

Dernière(s) publication(s) au LIMOS :

Toutes les publications de Vincent BARRA au LIMOS

Dernière(s) publication(s) au LIMOS :
2025
COMM
Aya Ferchichi, Ali Ben Abbess, Vincent Barra, Imed Riadh Farah
Trustworthy AI for Spatio-Temporal Forecasting via Counterfactual Causality
IEEE International Conference on Tools with Artificial Intelligence - 2025
Informatique/Traitement du signal et de l'image
2025
COMM
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Vincent Barra, Johann Foucher
Deep Learning-Based on Feature Enhancement Module for Outer and Inner Object Segmentation in Semiconductor Images: Applications in Annotation and Metrology
17th International Conference on Quality Control by Artificial Vision (QCAV) - 2025
Informatique/Traitement du signal et de l'image
2025
COMM
Marion Grould, Alexandre Seiller, Julien Baderot, Arnaud Guillin, Vincent Barra, Léo Mazauric, Ali Hallal, Sergio Martinez, Johann Foucher
Process optimization assistant powered with AI driven digital twin: multiobjective processes use case
DTCO and Computational Patterning IV - 2025
Informatique/Traitement du signal et de l'image
2025
COMM
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Léo Mazauric, Vincent Barra, Sergio Martinez, Johann Foucher
Metrology and segmentation in SEM/TEM imaging: accelerating semiconductor analysis through advanced deep learning techniques
Metrology, Inspection, and Process Control XXXIX - 2025
Informatique/Traitement du signal et de l'image
2025
ART
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Vincent Barra, Léo Mazauric, Johann Foucher
Deep Learning-Driven Automation of Inner and Outer Objects Segmentation in SEM/TEM Imaging for High-Throughput Semiconductor Metrology
Journal of Micro/Nanopatterning, Materials, and Metrology - 2025
Informatique/Traitement du signal et de l'image