Présentation
Le Laboratoire d'Informatique, de Modélisation et d'Optimisation des Systèmes (LIMOS) est une Unité Mixte de Recherche (UMR 6158) en informatique, et plus généralement en Sciences et Technologies de l'Information et de la Communication (STIC).
(lire la suite)Keynotes à venir
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Eric Colin de Verdière, Directeur de Recherche CNRS - LIGM - Champs-sur-Marne - 12 mars 2026 00:00 - None Algorithms for drawing graphs with no or few crossings in the plane, on surfaces, and beyond |
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Dernières Publications
Didier Rullière, Marc Grossouvre - 24 octobre 2025
A Joint Kriging Model with Application to Constrained Classification
Statistics and Computing
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Vincent Barra, Léo Mazauric, Johann Foucher - 9 octobre 2025
Deep Learning-Driven Automation of Inner and Outer Objects Segmentation in SEM/TEM Imaging for High-Throughput Semiconductor Metrology
Journal of Micro/Nanopatterning, Materials, and Metrology
Hamed Gholami, Xavier Delorme, Alexandre Dolgui - 4 novembre 2025
An intelligent data-driven model for sustainable-resilient supplier scrutiny and selection in sustainable reconfigurable manufacturing systems
International Journal of Production Research
Hao Ding, Jing Sun, Rui Long, Xiaoping Jiang, Hongling Shi, Yuting Qin, Zongze Li, Jian-Jin Li - 10 septembre 2025
Visible-Infrared Person Re-Identification Based on Feature Decoupling and Refinement
ACM Transactions on Multimedia Computing, Communications and Applications
Dibyayan Chakraborty, Jérémie Chalopin, Florent Foucaud, Yann Vaxès - 1 janvier 2026
Isometric path complexity of graphs
Discrete Mathematics
A Joint Kriging Model with Application to Constrained Classification
Statistics and Computing
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Vincent Barra, Léo Mazauric, Johann Foucher - 9 octobre 2025
Deep Learning-Driven Automation of Inner and Outer Objects Segmentation in SEM/TEM Imaging for High-Throughput Semiconductor Metrology
Journal of Micro/Nanopatterning, Materials, and Metrology
Hamed Gholami, Xavier Delorme, Alexandre Dolgui - 4 novembre 2025
An intelligent data-driven model for sustainable-resilient supplier scrutiny and selection in sustainable reconfigurable manufacturing systems
International Journal of Production Research
Hao Ding, Jing Sun, Rui Long, Xiaoping Jiang, Hongling Shi, Yuting Qin, Zongze Li, Jian-Jin Li - 10 septembre 2025
Visible-Infrared Person Re-Identification Based on Feature Decoupling and Refinement
ACM Transactions on Multimedia Computing, Communications and Applications
Dibyayan Chakraborty, Jérémie Chalopin, Florent Foucaud, Yann Vaxès - 1 janvier 2026
Isometric path complexity of graphs
Discrete Mathematics