Présentation
Le Laboratoire d'Informatique, de Modélisation et d'Optimisation des Systèmes (LIMOS) est une Unité Mixte de Recherche (UMR 6158) en informatique, et plus généralement en Sciences et Technologies de l'Information et de la Communication (STIC).
(lire la suite)Séminaires à venir
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Charlotte LEFEVRE - Radboud Unbiversity - 26 novembre 2025 11:00 - salle A001 Permutation-Based Hashing With Stronger (Second) Preimage Resistance |
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Soutenances de thèses
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Thanhloan NGUYEN - 25 novembre 2025 09:00 - salle A002 Solutions de négociation pour l'optimisation combinatoire à deux objectifs et applications à certains problèmes de couverture de graphe |
Dernières Publications
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Vincent Barra, Léo Mazauric, Johann Foucher - 9 octobre 2025
Deep Learning-Driven Automation of Inner and Outer Objects Segmentation in SEM/TEM Imaging for High-Throughput Semiconductor Metrology
Journal of Micro/Nanopatterning, Materials, and Metrology
Cezar Mbiethieu, Norbert Tsopze, Engelbert Mephu Nguifo - 1 décembre 2025
XLITE-Unet: Extremely Light and Efficient Deep learning architecture with selective atrous and axial depthwise convolution for image segmentation
Computer Vision and Image Understanding
Sylvie Rousset, Carole Brun, Gil Boudet, Philippe Lacomme, Frédéric Dutheil - 5 septembre 2025
Associations Between Stress Level, Environment, and Emotional and Behavioral Characteristics in Service Sector Employees
International Journal of Environmental Research and Public Health
Dibyayan Chakraborty, Florent Foucaud, Anni Hakanen - 1 novembre 2025
Distance-based (and path-based) covering problems for graphs of given cyclomatic number
Discrete Mathematics
Khadija Hadj Salem, Arthur Kramer, Alexis Robbes - 1 septembre 2025
Job sequencing and tool switching problem with non-identical parallel machines: Mathematical formulations and modeling improvements
European Journal of Operational Research
Deep Learning-Driven Automation of Inner and Outer Objects Segmentation in SEM/TEM Imaging for High-Throughput Semiconductor Metrology
Journal of Micro/Nanopatterning, Materials, and Metrology
Cezar Mbiethieu, Norbert Tsopze, Engelbert Mephu Nguifo - 1 décembre 2025
XLITE-Unet: Extremely Light and Efficient Deep learning architecture with selective atrous and axial depthwise convolution for image segmentation
Computer Vision and Image Understanding
Sylvie Rousset, Carole Brun, Gil Boudet, Philippe Lacomme, Frédéric Dutheil - 5 septembre 2025
Associations Between Stress Level, Environment, and Emotional and Behavioral Characteristics in Service Sector Employees
International Journal of Environmental Research and Public Health
Dibyayan Chakraborty, Florent Foucaud, Anni Hakanen - 1 novembre 2025
Distance-based (and path-based) covering problems for graphs of given cyclomatic number
Discrete Mathematics
Khadija Hadj Salem, Arthur Kramer, Alexis Robbes - 1 septembre 2025
Job sequencing and tool switching problem with non-identical parallel machines: Mathematical formulations and modeling improvements
European Journal of Operational Research