Présentation
Le Laboratoire d'Informatique, de Modélisation et d'Optimisation des Systèmes (LIMOS) est une Unité Mixte de Recherche (UMR 6158) en informatique, et plus généralement en Sciences et Technologies de l'Information et de la Communication (STIC).
(lire la suite)Keynotes à venir
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Le Thi Hoai An - Université de Lorraine - 25 novembre 2025 14:30 - Salle A102 Titre a venir |
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Séminaires à venir
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Olivier Hess - Eviden - 14 novembre 2025 11:00 - Amphi 2 - Pôle commun Emulation d'ordinateurs quantiques (QPU) |
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Dernières Publications
Hassan Maatouk, Didier Rullière, Xavier Bay - 23 septembre 2025
Efficient constrained Gaussian process approximation using elliptical slice sampling
Bayesian Analysis
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Vincent Barra, Léo Mazauric, Johann Foucher - 9 octobre 2025
Deep Learning-Driven Automation of Inner and Outer Objects Segmentation in SEM/TEM Imaging for High-Throughput Semiconductor Metrology
Journal of Micro/Nanopatterning, Materials, and Metrology
Youssef Salman, Anis Hoayek, Mireille Batton-Hubert - 9 octobre 2025
Detecting Mean Shifts in a Class of Time Series CHARN Models with Application to Financial Data
Journal of Scientific Research and Reports
Sylvie Rousset, Carole Brun, Gil Boudet, Philippe Lacomme, Frédéric Dutheil - 5 septembre 2025
Associations Between Stress Level, Environment, and Emotional and Behavioral Characteristics in Service Sector Employees
International Journal of Environmental Research and Public Health
Khadija Hadj Salem, Arthur Kramer, Alexis Robbes - 1 septembre 2025
Job sequencing and tool switching problem with non-identical parallel machines: Mathematical formulations and modeling improvements
European Journal of Operational Research
Efficient constrained Gaussian process approximation using elliptical slice sampling
Bayesian Analysis
Isaac Wilfried Sanou, Julien Baderot, Ali Hallal, Vincent Barra, Léo Mazauric, Johann Foucher - 9 octobre 2025
Deep Learning-Driven Automation of Inner and Outer Objects Segmentation in SEM/TEM Imaging for High-Throughput Semiconductor Metrology
Journal of Micro/Nanopatterning, Materials, and Metrology
Youssef Salman, Anis Hoayek, Mireille Batton-Hubert - 9 octobre 2025
Detecting Mean Shifts in a Class of Time Series CHARN Models with Application to Financial Data
Journal of Scientific Research and Reports
Sylvie Rousset, Carole Brun, Gil Boudet, Philippe Lacomme, Frédéric Dutheil - 5 septembre 2025
Associations Between Stress Level, Environment, and Emotional and Behavioral Characteristics in Service Sector Employees
International Journal of Environmental Research and Public Health
Khadija Hadj Salem, Arthur Kramer, Alexis Robbes - 1 septembre 2025
Job sequencing and tool switching problem with non-identical parallel machines: Mathematical formulations and modeling improvements
European Journal of Operational Research